ADAQ23878BBCZ

ADAQ23878BBCZ is a precision, high speed, μModule® data acquisition solution that reduces the development cycle of precision measurement systems by transferring the design burden of component selection, optimization, and layout from the designer to the device. Using system-in-package (SIP) technology, this device reduces end system component count by combining multiple common signal processing and conditioning blocks in a single device, including a low noise, fully differential ADC driver amplifier (FDA), a stable reference buffer, and a high speed, 18-bit, 15MSPS successive approximation register (SAR) ADC. It is used in applications such as automatic test equipment, data acquisition, hardware in the loop (HiL), power analysers, non-destructive test (acoustic emissions), mass spectrometry, traveling wave fault location, medical imaging and instruments.

• Integrated fully differential ADC driver with signal scaling
• Single-ended to differential conversion, pin selectable input range with overrange
• Critical passive components, 0.005% precision matched resistor array for FDA
• On-board reference buffer with VCMO generation, serial LVDS interface
• Integral nonlinearity error is ±3.1ppm typical at (VDD = 5V ±5%, VS+ = 5V ±5%)
• Gain error is ±0.005%FS typical at (VDD = 5V ±5%, VS+ = 5V ±5%)
• Gain error drift is ±0.13ppm/°C typical at (VDD = 5V ±5%, VS+ = 5V ±5%)
• Signal-to-noise-and-distortion is 90.4dB typical at (gain = 0.37 and gain = 0.87)
• Total harmonic distortion is -109.9dB typical at (gain = 0.37, VDD = 5V ±5%, VS+ = 5V ±5%)
• Operating temperature range from -40°C to +85°C, 100-ball CSP-BGA package

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